Test method for meas standards english version

NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA

GB/T 30867-2014

Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers

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The Standardization Administration of the People's Republic of China

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GB Standard Code	GB/T 30867-2014
Standard Category	China National Standards
GB Standard English Title	Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers
GB Standard Chinese Title	碳化硅单晶片厚度和总厚度变化测试方法
Chinese Version Price	$15 USD per 50 pages
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